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Communication Dans Un Congrès Année : 2010

Influence of the electron cross-field diffusion in negative ion sources with the transverse magnetic field and the plasma-electrode bias

M. Bacal
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S. Kuppel
D. Matsushita
  • Fonction : Auteur
A. Hatayama
  • Fonction : Auteur

Résumé

The physical mechanisms involved in the extraction of H- ions from the negative ion source are studied with a PIC 2D3V code. The effect of a weak magnetic field transverse to the extraction direction is taken into account, along with a variable bias voltage applied on the plasma electrode (PE). In addition to previous modeling works, the electron diffusion across the magnetic field is taken into account as a simple one-dimensional random-walk process. The results show that without PE bias, the value of the diffusion coefficient has a significant influence upon the value of the extracted H- current. However, the value of this coefficient does not affect qualitatively the mechanism leading to the peak of extracted H- ion current observed for an optimum value of the PE bias.
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Dates et versions

hal-02893267 , version 1 (08-07-2020)

Identifiants

  • HAL Id : hal-02893267 , version 1

Citer

M. Bacal, S. Kuppel, D. Matsushita, A. Hatayama. Influence of the electron cross-field diffusion in negative ion sources with the transverse magnetic field and the plasma-electrode bias. 13th International Conference on Ion Sources, Sep 2009, Gatlinburg, Tennessee, United States. pp.02B503. ⟨hal-02893267⟩
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