eC-CLEM: Flexible Multidimensional Registration Software for Correlative Microscopies with Refined Accuracy Mapping - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microscopy and Microanalysis Année : 2017

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hal-02735782 , version 1 (02-06-2020)

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Xavier Heiligenstein, Perrine Paul-Gilloteaux, Martin Belle, Graca Raposo, Jean Salamero. eC-CLEM: Flexible Multidimensional Registration Software for Correlative Microscopies with Refined Accuracy Mapping. Microscopy and Microanalysis, 2017, 23 (S1), pp.360-361. ⟨10.1017/S1431927617002483⟩. ⟨hal-02735782⟩
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