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Pré-Publication, Document De Travail Année : 2020

Single-shot X-ray Absorption Spectroscopy at X-ray Free Electron Lasers

Résumé

X-ray Absorption Spectroscopy (XAS) is a widely used X-ray diagnostic method. While synchrotrons have large communities of XAS users, its use on X-Ray Free Electron Lasers (XFEL) facilities has been rather limited. At a first glance, the relatively narrow bandwidth and the highly fluctuating spectral structure of XFEL sources seem to prevent high-quality XAS measurements without accumulating over many shots. Here, we demonstrate for the first time the collection of single-shot XAS spectra on an XFEL, with error bars of only a few percent, over tens of eV. We show how this technique can be extended over wider spectral ranges towards Extended X-ray Absorption Fine Structure (EXAFS) measurements, by concatenating a few tens of single-shot measurements. Such results open indisputable perspectives for future femtosecond time resolved XAS studies, especially for transient processes that can be initiated at low repetition rate.

Dates et versions

hal-02634666 , version 1 (27-05-2020)

Identifiants

Citer

M. Harmand, A.G. Krygier, Marco Cammarata, M. Chollet, H.T. Lemke, et al.. Single-shot X-ray Absorption Spectroscopy at X-ray Free Electron Lasers. 2020. ⟨hal-02634666⟩
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