Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method

Résumé

The Near Field Scan Immunity (NFSI) method developed to evaluate the susceptibility level of Integrated Circuits (IC) could be used with appropriate probes to perform a quick investigation at application board level. This paper presents the study of a drain-source current sensor typically used in DC/DC converter.

Domaines

Sciences de l'ingénieur [physics] Electromagnétisme Electronique

Sonia Ben Dhia  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-02523743

Soumis le : dimanche 29 mars 2020-16:33:20

Dernière modification le : mercredi 30 octobre 2024-19:41:23

Fichier non déposé

Dates et versions

hal-02523743 , version 1 (29-03-2020)

Identifiants

Citer

André Durier, Sonia Ben Dhia, Tristan Dubois. Study of the radiated immunity of a drain-source current sensor using Near Field Scan Immunity method. 2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo), Oct 2019, Hangzhou, China. pp.52-54, ⟨10.1109/EMCCompo.2019.8919720⟩. ⟨hal-02523743⟩

Exporter

BibTeX XML-TEI Dublin Core DC Terms EndNote DataCite

Collections

UNIV-TLSE2 CNRS INSA-TOULOUSE LAAS IMS-BORDEAUX UT1-CAPITOLE IMS-BORDEAUX-FUSION LAAS-ESE LAAS-GESTION-DE-L-ENERGIE IRT_SAINT-EXUPERY INSA-GROUPE INSA-TOULOUSE-GEI ANR TOULOUSE-INP UNIV-UT3 UT3-TOULOUSEINP
64 Consultations
0 Téléchargements

Altmetric

Partager

More