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Article Dans Une Revue IEEE Transactions on Electromagnetic Compatibility Année : 2009

The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future

Mohamed Ramdani
James Whalen
  • Fonction : Auteur
Todd Hubing
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Mart Coenen
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Osami Wada
  • Fonction : Auteur

Résumé

Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.

Dates et versions

hal-02523680 , version 1 (29-03-2020)

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Citer

Mohamed Ramdani, Etienne Sicard, Alexandre Boyer, Sonia Ben Dhia, James Whalen, et al.. The Electromagnetic Compatibility of Integrated Circuits—Past, Present, and Future. IEEE Transactions on Electromagnetic Compatibility, 2009, 51 (1), pp.78-100. ⟨10.1109/TEMC.2008.2008907⟩. ⟨hal-02523680⟩
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