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Article Dans Une Revue Microelectronics Reliability Année : 2018

Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses

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hal-02499971 , version 1 (05-03-2020)

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Omar Chihani, Loïc Théolier, Alain Bensoussan, Jean-Yves Delétage, André Durier, et al.. Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses. Microelectronics Reliability, 2018, 88-90, pp.402-405. ⟨10.1016/j.microrel.2018.07.076⟩. ⟨hal-02499971⟩
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