Article Dans Une Revue IEEE Transactions on Nuclear Science Année : 2020

Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients

Résumé

This article assesses, for the first time, a body/bulk built-in current sensor (BBICS) in a CMOS 65-nm test chip under thermal neutron, high-energy neutron, and laser radiation. Experimental results suggest that the on-chip current sensor is effective to detect transient faults in different case-study subcircuits of the chip exposed to the accelerated radiation effects, opening prospects for embedding this type of sensor in reliable, secure, and low-power integrated circuit applications

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Dates et versions

hal-02482517 , version 1 (18-02-2020)

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Rodrigo Possamai Bastos, Jean-Max Dutertre, Matheus Garay Trindade, Raphael Andreoni Camponogara-Viera, Olivier Potin, et al.. Assessment of On-Chip Current Sensor for Detection of Thermal-Neutron Induced Transients. IEEE Transactions on Nuclear Science, 2020, 67 (7), pp.1404-1411. ⟨10.1109/tns.2020.2975923⟩. ⟨hal-02482517⟩
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