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Book Sections Year : 2017

Manufacturing Threats

Abstract

This chapter introduces an overview of the main reliability threats of last nanoscale generations of CMOS technology designs. In particular, the chapter focuses on sources of process variability and their impact on circuit design and their performances, but also on the runtime variability such as voltage fluctuations as well soft errors. Further to that we go over the transistor aging provoked by different wear-out physical effects such as Bias Temperature Instability (BTI), Hot Carrier Injection (HCI), Random Telegraph Noise (RTN) and Time-Dependent Dielectric Breakdown (TDDB).

Dates and versions

hal-02473938 , version 1 (11-02-2020)

Licence

Attribution - NonCommercial

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Saman Kiamehr, Mehdi B. Tahoori, Lorena Anghel. Manufacturing Threats. Dependable Multicore Architectures at Nanoscale, springer, pp.3-35, 2017, 978-3-319-54421-2. ⟨10.1007/978-3-319-54422-9⟩. ⟨hal-02473938⟩

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