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Communication Dans Un Congrès Année : 2019

Topology and design investigation on thin film silicon BIMOS device for ESD protection in FD-SOI technology

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hal-02457693 , version 1 (28-01-2020)

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Philippe Galy, Louise de Conti, Maud Vinet, S. Cristoloveanu, G. Delahaye, et al.. Topology and design investigation on thin film silicon BIMOS device for ESD protection in FD-SOI technology. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF'2019), Sep 2019, Toulouse, France. ⟨hal-02457693⟩
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