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Journal Articles Journal of Applied Physics Year : 2019

In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy

Abstract

We report on the ultrafast vibrational response of single Ge-Si core-shell nanowires obtained by epitaxial growth and investigated by femtosecond transient reflectivity and coherent x-ray diffraction measurements. The oscillations of the sample reflectivity are correlated with the fundamental breathing mode for wires with a diameter ranging from 150 to 350 nm and compared with solutions of the Navier equation. Taking advantage of a free standing geometry, we are able to get a mechanical quality factor of higher than 80. Coupling electron microscopy and pump and probe investigations with a very high spectral resolution performed on the same wire, we demonstrate that both shell and core diameter fluctuations are revealed and quantified. X-ray coherent diffraction measurements on individual nanowires evidence changes in the Ge-core diameter and different strain states along a single structure.
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hal-02457440 , version 1 (29-01-2020)

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Sara Fernandez, Cyril Jean, Eric Charron, Pascal Gentile, Marie-Ingrid Richard, et al.. In depth characterization of Ge-Si core-shell nanowires using X-ray coherent diffraction and time resolved pump-probe spectroscopy. Journal of Applied Physics, 2019, 126 (20), pp.204304. ⟨10.1063/1.5122263⟩. ⟨hal-02457440⟩
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