Journal Articles
Solid-State Electronics
Year : 2018
Bogdan Cretu : Connect in order to contact the contributor
https://hal.science/hal-02438730
Submitted on : Tuesday, January 14, 2020-12:26:40 PM
Last modification on : Wednesday, March 20, 2024-4:20:04 PM
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D. Boudier, B Cretu, E. Simoen, A. Veloso, N. Collaert. Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures. Solid-State Electronics, 2018, 143, pp.27-32. ⟨10.1016/j.sse.2018.02.015⟩. ⟨hal-02438730⟩
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