OLED ageing signature characterization under combined thermal and electrical stresses - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2014

Dates et versions

hal-02435745 , version 1 (04-04-2024)

Identifiants

Citer

Pascal Dupuis, Alaa Alchaddoud, Laurent Canale, Georges Zissis. OLED ageing signature characterization under combined thermal and electrical stresses. 2014 International Symposium on Electrical Insulating Materials (ISEIM), Jun 2014, Niigata, Japan. pp.311-314, ⟨10.1109/ISEIM.2014.6870781⟩. ⟨hal-02435745⟩
40 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More