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Conference Papers Year : 2020

Deep learning-based speckle decorrelation denoising for wide-field optical metrology

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hal-02434956 , version 1 (10-01-2020)

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  • HAL Id : hal-02434956 , version 1

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Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩
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