Conference Papers
Year : 2020
Marie Tahon : Connect in order to contact the contributor
https://hal.science/hal-02434956
Submitted on : Friday, January 10, 2020-2:31:26 PM
Last modification on : Friday, March 24, 2023-2:53:14 PM
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- HAL Id : hal-02434956 , version 1
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Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩
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