Deep learning-based speckle decorrelation denoising for wide-field optical metrology - Archive ouverte HAL
Communication Dans Un Congrès Année : 2020

Deep learning-based speckle decorrelation denoising for wide-field optical metrology

Fichier non déposé

Dates et versions

hal-02434956 , version 1 (10-01-2020)

Identifiants

  • HAL Id : hal-02434956 , version 1

Citer

Silvio Montrésor, Marie Tahon, Antoine Laurent, Pascal Picart. Deep learning-based speckle decorrelation denoising for wide-field optical metrology. Optics and Photonics for Advanced Dimensional Metrology, International Society for Optics and Photonics (SPIE), Apr 2020, Strasbourg, France. ⟨hal-02434956⟩
144 Consultations
0 Téléchargements

Partager

More