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Article Dans Une Revue IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Année : 2019

Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits -Part I

Benjamin Viale
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Résumé

This paper describes a systematic and scalable ElectroStatic Discharge (ESD) verification methodology embodied in a tool called ESD IP Explorer that has been specifically implemented to cover the entire design flow and to comply with custom circuit architectures. The tool identifies the ESD protection network of a circuit thanks to a flexible topology-aware mechanism and converts the circuit description of this network into a directed graph whose edges are provided with quasistatic electrical behaviors inferred from machine learning techniques detailed in a companion paper Viale2020. A graph-based analysis establishes a risk rating cartography for all top-level pad-to-pad discharge combinations. The circuit reviewer, a chip designer or an ESD expert, can therefore assess the ESD performances of the ESD network under study and easily investigate potential ESD design weaknesses.
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Dates et versions

hal-02424335 , version 1 (27-12-2019)

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Benjamin Viale, Bruno Allard. Scalable and Versatile Design Guidance Tool for the ESD Robustness of Integrated Circuits -Part I. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2019, pp.1-1. ⟨10.1109/TCAD.2019.2962120⟩. ⟨hal-02424335⟩
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