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Communication Dans Un Congrès Année : 2018

Degradation processes and origin in InGaN-based high-power photodetectors

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hal-02356755 , version 1 (08-11-2019)

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Carlo de Santi, Matteo Meneghini, Alessandro Caria, Ezgi Dogmus, Malek Zegaoui, et al.. Degradation processes and origin in InGaN-based high-power photodetectors. Gallium Nitride Materials and Devices XIII, Jan 2018, San Francisco, United States. pp.54, ⟨10.1117/12.2289466⟩. ⟨hal-02356755⟩
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