InAlN as a functional inorganic material is a promising alternative to the commonly used InGaN in tunnel diodes and optoelectronic devices, due to its tunable wider range of energy bandgap (0.65–6.2 eV), thus empowering utilization of the whole solar spectrum. Moreover, high electron drift velocity and carrier concentration are considered as the most desirable prerequisite of indium-rich InAlN. N-polar indium-rich InAlN could be more beneficial due to the reverse direction of the polarization compared to Ga-polar. However, unanswered questions persist concerning growth evolution of N-polar indium-rich InAlN grown by organometallic chemical vapor deposition (OMCVD). In this study, energy dispersive X-ray spectroscopy (EDX) and high-angle annular dark-field (HAADF) imaging are used to characterize N-polar layer at nanometer scale in order to determine the evolution of the layer on (0001) sapphire substrate. Long nitridation of sapphire substrate leading to the formation of ~2 nm AlON ultrathin interlayer, which relaxes strain at the InAlN/sapphire interface with assistance of a low-temperature AlN interlayer is observed. EDX analysis confirms that after strain relaxation of InAlN layer, the indium-incorporation has only a weak dependence on the polarity of the layer. The incorporation of indium at preferential sites is also discussed at length.