Ohmic contacts study of P + N diodes on (111) and (100) diamond - Archive ouverte HAL
Communication Dans Un Congrès Année : 2019

Ohmic contacts study of P + N diodes on (111) and (100) diamond

Résumé

Pseudo-vertical P + N diamond diodes are fabricated. We focused on the determination of specific contact resistance of Ti-based contacts for (111) and (100) p-type diamond layers doped around 10 19 at/cm 3 using circular Transfer Length Method (cTLM). Ohmic behavior is obtained and the variation of the specific contact resistance is discussed.
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Dates et versions

hal-02324743 , version 1 (22-10-2019)

Identifiants

  • HAL Id : hal-02324743 , version 1

Citer

Lya Fontaine, Karine Isoird, Josiane Tasselli, Patrick Austin, Alain Cazarré, et al.. Ohmic contacts study of P + N diodes on (111) and (100) diamond. 13th IEEE International Conference on Power Electronics and Drive Systems (PEDS 2019), Jul 2019, Toulouse, France. ⟨hal-02324743⟩
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