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Pré-Publication, Document De Travail Année : 2019

Control of the mechanical stress induced by dielectric thin films to engineer optical properties in semiconductor materials and devices [Defense 24.01.2023]

Control of the mechanical stress induced by dielectric thin films to engineer optical properties in semiconductor materials and devices [Soutenance 24.01.2023]

Brahim Ahammou

Résumé

supervisor Jean-pierre Landesman (department of materials - nanosciences), Christophe Levallois (FOTON-INSA) and Peter Mascher (McMaster University)
sous la direction de Jean-pierre Landesman dans le département Matériaux-Nanosciences, Christophe Levallois (FOTON-INSA) et Peter Mascher (McMaster University)

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Dates et versions

hal-02286088 , version 1 (13-09-2019)

Identifiants

  • HAL Id : hal-02286088 , version 1

Citer

Brahim Ahammou. Control of the mechanical stress induced by dielectric thin films to engineer optical properties in semiconductor materials and devices [Defense 24.01.2023]. 2019. ⟨hal-02286088⟩
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