DETERMINATION OF SiO MOLECULE CONCENTRATION IN A DISCHARGE BY COMPARING SELF-ABSORBED AND ABSORBED EXPERIMENTAL SPECTRA WITH SIMULATED ONE - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes Année : 2002

DETERMINATION OF SiO MOLECULE CONCENTRATION IN A DISCHARGE BY COMPARING SELF-ABSORBED AND ABSORBED EXPERIMENTAL SPECTRA WITH SIMULATED ONE

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Matériaux Plasmas
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hal-02179048 , version 1 (10-07-2019)

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Olivier Motret, F. Coursimault, R. Viladrosa, Jean-Michel Pouvesle. DETERMINATION OF SiO MOLECULE CONCENTRATION IN A DISCHARGE BY COMPARING SELF-ABSORBED AND ABSORBED EXPERIMENTAL SPECTRA WITH SIMULATED ONE. High Temperature Material Processes: An International Quarterly of High-Technology Plasma Processes, 2002, 6 (3), pp.6. ⟨10.1615/HighTempMatProc.v6.i3.30⟩. ⟨hal-02179048⟩
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