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Article Dans Une Revue Metrologia Année : 2015

Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context

Résumé

1/f noise is very common but is difficult to handle in a metrological way. After having recalled the main characteristics of a strongly correlated noise, this paper will determine relationships giving confidence intervals over the arithmetic mean and the linear drift parameters. A complete example of processing of an actual measurement sequence affected by 1/f noise will be given.
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Dates et versions

hal-02134463 , version 1 (20-05-2019)

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François Vernotte, Eric Lantz. Metrology and 1/f noise: linear regressions and confidence intervals in flicker noise context. Metrologia, 2015, 52 (2), pp.222 - 237. ⟨10.1088/0026-1394/52/2/222⟩. ⟨hal-02134463⟩
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