PROCESSING AND CHARACTERIZATION OF THIN FILM Cux(Ge28Se60Sb12)1-x ION-SELECTIVE ELECTRODE MEMBRANE - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Chalcogenide Letters Année : 2008

PROCESSING AND CHARACTERIZATION OF THIN FILM Cux(Ge28Se60Sb12)1-x ION-SELECTIVE ELECTRODE MEMBRANE

Résumé

This work relates to the elaboration and characterization of Ion-Selective Electrodes (ISEs) based upon chalcogenide membrane sensitive to Cu2+ ion in aqueous solution for continuous and in situ measurements. The membrane material is a thin film deposited by RF co-sputtering of Ge28Se60Sb12chalcogenide glass and metal copper. The composition of the film highly doped with copper was analysed using Energy Dispersive Spectroscopy (EDS) and Secondary Ion Mass Spectrometry (SIMS). The membrane / solution interface interactions were characterised using X-ray Photoelectronic Spectroscopy (XPS) and Electrochemical Impedance Spectroscopy (EIS). These miniaturised ISEs exhibit Nernstian responses (30 mV / pCu) in a large copper (II) concentration range and a detection limit close to 1×10-6 M.
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hal-02122058 , version 1 (16-05-2019)

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  • HAL Id : hal-02122058 , version 1

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F. O. Mear, M. Essi, Marie-Françoise Guimon, A. Pradel. PROCESSING AND CHARACTERIZATION OF THIN FILM Cux(Ge28Se60Sb12)1-x ION-SELECTIVE ELECTRODE MEMBRANE. Chalcogenide Letters, 2008, 5 (6), pp.117-124. ⟨hal-02122058⟩
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