Structural characterization of a Cu(II) thin-film aging in a Cu-nitrate solution - Archive ouverte HAL
Article Dans Une Revue Applied Surface Science Année : 2009

Structural characterization of a Cu(II) thin-film aging in a Cu-nitrate solution

Résumé

The response of thin-film copper (II) ion-selective electrodes based on chalcogenide glassy Cu–Sb–Ge–Se is described according to the soaking time in a 10−4 M copper (II) solution. The chalcogenide membrane/solution interface has been investigated by using electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) in order to understand the sensing properties. During the first month of the soaking, an alteration of the membrane by a chemical change without alteration of the sensor detection performance has been observed.

Dates et versions

hal-02122050 , version 1 (07-05-2019)

Identifiants

Citer

F.O. Mear, M. Essi, P. Sistat, Marie-Francoise Guimon, Danielle Gonbeau, et al.. Structural characterization of a Cu(II) thin-film aging in a Cu-nitrate solution. Applied Surface Science, 2009, 255 (13-14), pp.6607-6611. ⟨10.1016/j.apsusc.2009.02.051⟩. ⟨hal-02122050⟩
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