An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microscopy and Microanalysis Année : 2019

An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography

Fichier non déposé

Dates et versions

hal-02107351 , version 1 (23-04-2019)

Identifiants

Citer

Zirong Peng, Yifeng Lu, Constantinos Hatzoglou, Alisson Kwiatkowski da Silva, François Vurpillot, et al.. An Automated Computational Approach for Complete In-Plane Compositional Interface Analysis by Atom Probe Tomography. Microscopy and Microanalysis, 2019, 25, pp.389-400. ⟨10.1017/S1431927618016112⟩. ⟨hal-02107351⟩
20 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More