Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography - Archive ouverte HAL Access content directly
Conference Papers Year : 2016

Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography

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hal-02082375 , version 1 (28-03-2019)

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  • HAL Id : hal-02082375 , version 1

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B. Han, Yasuo Shimizu, Gabriele Seguini, Elisa Arduca, Celia Castro, et al.. Characterization of Si Nanocrystals Embedded in SiO2 Matrix by Atom Probe Tomography. EMN Meeting on Nanocrystals, Oct 2016, Xi'an, China. ⟨hal-02082375⟩
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