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Journal Articles Applied Physics Letters Year : 2015

Nanoscale calibration of n-type ZnO staircase structures by scanning capacitance microscopy

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Engineering Sciences [physics] Materials Micro and nanotechnologies/Microelectronics

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https://hal.science/hal-02073148

Submitted on : Tuesday, March 19, 2019-4:22:04 PM

Last modification on : Friday, May 3, 2024-11:43:43 AM

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hal-02073148 , version 1 (19-03-2019)

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L. Wang, J. Laurent, J. Chauveau, V. Sallet, F. Jomard, et al.. Nanoscale calibration of n-type ZnO staircase structures by scanning capacitance microscopy. Applied Physics Letters, 2015, 107 (19), pp.192101. ⟨10.1063/1.4935349⟩. ⟨hal-02073148⟩

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