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Journal Articles physica status solidi (c) Year : 2016

Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy

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Engineering Sciences [physics] Materials Micro and nanotechnologies/Microelectronics

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https://hal.science/hal-02073118

Submitted on : Tuesday, March 19, 2019-4:10:39 PM

Last modification on : Thursday, April 11, 2024-1:08:12 PM

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hal-02073118 , version 1 (19-03-2019)

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Lin Wang, Sophie Guillemin, Jean-Michel Chauveau, Vincent Sallet, François Jomard, et al.. Characterization of carrier concentration in ZnO nanowires by scanning capacitance microscopy. physica status solidi (c), 2016, 13 (7-9), pp.576-580. ⟨10.1002/pssc.201510268⟩. ⟨hal-02073118⟩

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