Stability and in depth characterization of low-voltage organic thin film transistors based on low-k/high-k bilayer dielectric - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2018
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hal-02051882 , version 1 (28-02-2019)

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Alexandre Gaïtis, Micaël Charbonneau, Gérard Ghibaudo, R. Coppard, Christophe Serbutoviez. Stability and in depth characterization of low-voltage organic thin film transistors based on low-k/high-k bilayer dielectric. Innovations in large-Area Electronics Conference (InnoLAE), Jan 2018, Hinxton, United Kingdom. ⟨hal-02051882⟩
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