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Communication Dans Un Congrès Année : 2015
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hal-02051771 , version 1 (28-02-2019)

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  • HAL Id : hal-02051771 , version 1

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I. Messaris, T.A. Karatsori, Nikolaos Fasarakis, S. Nikolaidis, Gérard Ghibaudo, et al.. Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit applications. 4th International Conference on Modern Circuits and Systems Technologies (MOCAST), organized by the FP7 Marie Curie IAPP Project FTK, the Greek National projects NANOTRIM and NANOMOS and the Micro & Nano Scientific Society, May 2015, Thessaloniki, Greece. ⟨hal-02051771⟩
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