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Communication Dans Un Congrès Année : 2011

Analysis of SEU parameters for the study of SRAM cells reliability under radiation

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hal-02025650 , version 1 (19-02-2019)

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  • HAL Id : hal-02025650 , version 1

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K. Castellani-Coulié, Jean-Michel Portal, G. Micolau, Hassen Aziza. Analysis of SEU parameters for the study of SRAM cells reliability under radiation. 2011 12th Latin American Test Workshop - LATW, Mar 2011, Beach of Porto de Galinhas, France. pp.1-5. ⟨hal-02025650⟩
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