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Communication Dans Un Congrès Année : 2016

(Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation

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hal-02007827 , version 1 (05-02-2019)

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  • HAL Id : hal-02007827 , version 1

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I. Ionica, D. Damianos, A. Kaminski, G. Vitrant, D. Blanc-Pélissier, et al.. (Invited) Non-Destructive Characterization of Dielectric - Semiconductor Interfaces by Second Harmonic Generation. 229th ECS Meetings: 7th Int. Symposium on Dielectrics for Nanosystems: Materials Science, Processing, Reliability and Manufaturing - and - Solid State Topics General Session, D. Misra, K. Sundaram, H. Iwai, T. Chikyo, Y. Obeng, Z. Chen, D. Bauza, O. Leonte and K. Shimanura, May 2016, San Diego, United States. ⟨hal-02007827⟩
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