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Article Dans Une Revue International Journal of Advanced Manufacturing Technology Année : 2019

On the performance of VSI Shewhart control chart for monitoring the coefficient of variation in the presence of measurement errors

Résumé

In this paper, we propose a variable sampling interval Shewhart control chart to monitor the coefficient of variation (CV) squared, denoted by VSI SH-γ 2. The new model overcomes the ARL-biased (average run length) property of the control chart monitoring the CV in a previous study by designing two one-sided charts rather than one two-sided chart. Moreover, the effect of measurement error on the performance of the VSI SH-γ 2 control chart is investigated. The incorrect formula for the distribution of the CV in the presence of measurement error in a former study is fixed. Numerical simulations show that the precision errors and accuracy errors do have negative influences on the VSI SH-γ 2 chart. An appropriate strategy based on the obtained results is suggested to reduce these negative effects.
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Dates et versions

hal-02005536 , version 1 (14-11-2019)

Identifiants

Citer

Huu Du Nguyen, Quoc Thong Nguyen, Kim Phuc Tran, Dang Phuc Ho. On the performance of VSI Shewhart control chart for monitoring the coefficient of variation in the presence of measurement errors. International Journal of Advanced Manufacturing Technology, 2019, ⟨10.1007/s00170-019-03352-7⟩. ⟨hal-02005536⟩
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