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Article Dans Une Revue Materials Horizons Année : 2018

Electron tunneling through grain boundaries in transparent conductive oxides and implications for electrical conductivity: the case of ZnO:Al thin films

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Matériaux
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hal-01979154 , version 1 (12-01-2019)

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  • HAL Id : hal-01979154 , version 1

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Viet Huong Nguyen, Ulrich Gottlieb, Anthony Valla, Delfina Muñoz, Daniel Bellet, et al.. Electron tunneling through grain boundaries in transparent conductive oxides and implications for electrical conductivity: the case of ZnO:Al thin films. Materials Horizons, 2018, 5 (4), pp.715-726. ⟨hal-01979154⟩
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