Article Dans Une Revue Microelectronics Reliability Année : 2016

Performance vs. Reliability Adaptive Body Bias Scheme in 28nm & 14nm UTBB FDSOI nodes

DOI

Cite 10.1016/j.microrel.2016.07.085 Autre Ndiaye, C., Huard, V., Federspiel, X., Cacho, F., & Bravaix, A. (2016). Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes. Microelectronics Reliability, 64, 158–162. https://doi.org/10.1016/j.microrel.2016.07.085

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hal-01977447 , version 1 (10-01-2019)

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  • HAL Id : hal-01977447 , version 1

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Cheikh M. Ndiaye, Vincent Huard, Xavier Federspiel, Alain Bravaix. Performance vs. Reliability Adaptive Body Bias Scheme in 28nm & 14nm UTBB FDSOI nodes. Microelectronics Reliability, 2016, 64, pp.158-162. ⟨hal-01977447⟩
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