Performance vs. Reliability Adaptive Body Bias Scheme in 28nm & 14nm UTBB FDSOI nodes
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Cite 10.1016/j.microrel.2016.07.085 Autre Ndiaye, C., Huard, V., Federspiel, X., Cacho, F., & Bravaix, A. (2016). Performance vs. reliability adaptive body bias scheme in 28nm & 14nm UTBB FDSOI nodes. Microelectronics Reliability, 64, 158–162. https://doi.org/10.1016/j.microrel.2016.07.085