Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms - Archive ouverte HAL
Article Dans Une Revue Applied Physics Letters Année : 2014

Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms

Résumé

The less surface roughness scattering effects, owing to the unique operation principle, in junctionless nanowire transistors (JLT-NW) were shown by low-temperature characterization and 2D numerical simulation results. This feature could allow a better current drive under a high gate bias. In addition, the dominant scattering mechanisms in JLT-NW, with both a short (LM = 30 nm) and a long channel (LM = 10 μm), were investigated through an in-depth study of the temperature dependence of transconductance (gm) behavior and compared to conventional inversion-mode nanowire transistors.

Dates et versions

hal-01947628 , version 1 (07-12-2018)

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Dae-Young Jeon, So Jeong Jeon, Mireille Mouis, Sylvain Barraud, Gyu-Tae Kim, et al.. Low-temperature operation of junctionless nanowire transistors: Less surface roughness scattering effects and dominant scattering mechanisms. Applied Physics Letters, 2014, 105 (26), pp.263505. ⟨10.1063/1.4905366⟩. ⟨hal-01947628⟩
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