Calculation of the long-range order parameter from atom probe data
Résumé
In addition to the known diffraction techniques, field-ion microscopy with atom probe is well established for determining the long-range order parameter. The site occupation probabilities of the chemical species on the different sublattices may be estimated fronr experimental profiles; However, this evaluation method demands that the superstructure planes be identified unequivocally from the data. This condition is not fulfilled in all cases. We propose a new analytical method for which this condition need not be met. \textcopyright 1997 Elsevier Science Ltd.