The redistribution of boron in highly implanted 〈1 0 0〉 silicon (10 keV; 5×1015 at/cm2) annealed at 600 °C for 1 h was studied using both laser-assisted wide-angle atom probe (LaWaTAP) and secondary ion mass spectrometry (SIMS). As expected, the concentration was found to increase steeply to 1021 boron atoms/cm3 at a distance close to 35 nm and to decrease slowly to 1019/cm3, a value close to the boron level of the silicon substrate. For depth under 75 nm, the implantation profile of boron as given by LaWaTAP was found very close to that given by SIMS investigations without any calibration of the LaWaTAP data. For larger depth, the LaWaTAP profile is observed above that of SIMS. Detection limits of LaWaTAP for low dopant concentrations are discussed. The contribution of the background noise in the spectrum and sampling errors are considered. Fine-scale fluctuations not detected in SIMS profile and related to clustering were evidenced in LaWaTAP maps and profiles. Numerous boron clusters lying on \0 0 1\ planes parallel to the implanted surface, a few nanometer in size, were identified and interpreted as boron interstitial clusters (BICs), in agreement with Cristiano et al. observations. They contained between 50 and 300 atoms (Si and B). This is much higher than that generally assumed in particular in ab-initio modelling where a few atoms BICs are considered. These clusters contained 7 at% of boron in average. \textcopyright 2008.