Modification of Silicon Films and Nanostructures Deposition by Electric Field During UV Laser Ablation - Archive ouverte HAL
Communication Dans Un Congrès Année : 2000

Modification of Silicon Films and Nanostructures Deposition by Electric Field During UV Laser Ablation

Résumé

We present the experimental results on laser ablation and deposition of crystalline silicon. We show that using of ArF excimer laser (photon energy 6.4 eV) leads to high production rate of non-thermal and thermal ionized species. Non-thermal component corresponding to the UV light induced desorption was observed at fluence well below melting threshold. The origin of this one is discussed in the frame of the Coulomb explosion model. From time of flight spectra of slow thermal and rapid non-thermal silicon ions and target charge measurement we demonstrate the possibility to manipulate the time and space distribution of ablated particles by applying DC or pulsed electric fields during plume expansion. Analysis of films properties reveals strong influence of modified plume expansion dynamics on the Si film growth and on the condensation-deposition of Si nanocluster film under inert gas atmosphere.
Fichier non déposé

Dates et versions

hal-01897761 , version 1 (17-10-2018)

Identifiants

  • HAL Id : hal-01897761 , version 1

Citer

Igor Ozerov, Lionel Patrone, Marc Sentis, Wladimir Marine. Modification of Silicon Films and Nanostructures Deposition by Electric Field During UV Laser Ablation. E-MRS - IUMRS - ICEM 2000 Meeting (Symposium D – 'Photon-induced Material Processing'), May 2000, Strasbourg, France. ⟨hal-01897761⟩
39 Consultations
0 Téléchargements

Partager

More