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Communication Dans Un Congrès Année : 2003

Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC

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hal-01887685 , version 1 (04-10-2018)

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V. Pouget, D. Lewis, P. Fouillat. Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC. 2003 IEEE Instrumentation and Measurement Technology Conference (IMTC 2003), May 2003, Vail, United States. ⟨10.1109/IMTC.2003.1207976⟩. ⟨hal-01887685⟩
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