Journal Articles
Microelectronics Reliability
Year : 2003
Vincent Pouget : Connect in order to contact the contributor
https://hal.science/hal-01887645
Submitted on : Thursday, October 4, 2018-12:02:59 PM
Last modification on : Friday, March 24, 2023-2:53:08 PM
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- HAL Id : hal-01887645 , version 1
- DOI : 10.1016/S0026-2714(02)00282-2
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T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, P. Perdu, et al.. A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability, 2003, 43 (1), pp.173 - 177. ⟨10.1016/S0026-2714(02)00282-2⟩. ⟨hal-01887645⟩
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