A physical approach on SCOBIC investigation in VLSI - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 2003

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hal-01887645 , version 1 (04-10-2018)

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T. Beauchêne, D. Lewis, F. Beaudoin, V. Pouget, P. Perdu, et al.. A physical approach on SCOBIC investigation in VLSI. Microelectronics Reliability, 2003, 43 (1), pp.173 - 177. ⟨10.1016/S0026-2714(02)00282-2⟩. ⟨hal-01887645⟩
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