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Ouvrages Année : 1998

Thermal characterization of defects in an IC: Thermal testing

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hal-01840916 , version 1 (16-07-2018)

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  • HAL Id : hal-01840916 , version 1

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J. Altet, A. Rubio, Stefan A Dilhaire, Emmanuel Schaub, W. Claeys. Thermal characterization of defects in an IC: Thermal testing. pp.216-220, 1998, Therminic: Collection of Papers Presented at the International Worksop on Thermal Investigations of Ics and Microstructures, 2-913329-01-2. ⟨hal-01840916⟩

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