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Communication Dans Un Congrès Année : 2010

THE EXTENSION OF ID11 FOR NANOSCALE AND HIERARCHICAL CHARACTERIZATION

Résumé

Beamline ID11 at the ESRF has been recently upgraded by the complete redesign of the optics and by the extension of the beamline to 100 m in length. This has been coupled with the construction of a dedicated endstation for micro- and nano-focusing applications for diffraction and microscopy experiments in solid state chemistry, physics and materials science. Parallel detector schemes allow simultaneous characterization of samples over many length scales and throughout a multi-dimensional parameter space. We report the current ID11 scientific and technical status and the ongoing evolution.

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Matériaux
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Dates et versions

hal-01822656 , version 1 (25-06-2018)

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  • HAL Id : hal-01822656 , version 1

Citer

G. B. M. Vaughan, J. P. Wright, A. Bytchkov, C. Curfs, C. Gundlach, et al.. THE EXTENSION OF ID11 FOR NANOSCALE AND HIERARCHICAL CHARACTERIZATION. CHALLENGES IN MATERIALS SCIENCE AND POSSIBILITIES IN 3D AND 4D CHARACTERIZATION TECHNIQUES, 2010, POSTBOX 49, DK-4000 ROSKILDE, Denmark. pp.457-476. ⟨hal-01822656⟩
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