Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2016
Fichier non déposé

Dates et versions

hal-01787011 , version 1 (07-05-2018)

Identifiants

Citer

Marco Rigamonti, Piero Baraldi, Enrico Zio, Allegra Alessi, Daniel Astigarraga, et al.. Identification of the degradation state for condition-based maintenance of insulated gate bipolar transistors: A self-organizing map approach. Microelectronics Reliability, 2016, 60, pp.48 - 61. ⟨10.1016/j.microrel.2016.02.015⟩. ⟨hal-01787011⟩
76 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More