Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2014
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hal-01760459 , version 1 (06-04-2018)

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V. Della Marca, J. Postel-Pellerin, G. Just, P. Canet, J.-L. Ogier. Impact of endurance degradation on the programming efficiency and the energy consumption of NOR flash memories. Microelectronics Reliability, 2014, 54 (9-10), pp.2262 - 2265. ⟨10.1016/j.microrel.2014.07.063⟩. ⟨hal-01760459⟩
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