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Article Dans Une Revue Ultramicroscopy Année : 1998

Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films

Résumé

Electron energy loss spectroscopy (EELS) in the transmission electron microscope (TEM) is a very useful tool for identifying small secondary phases, for example, in YBCO off-stoichiometric thin films. Among these phases are the CuO and Y2BaCuO5 submicrometric precipitates and the Y2O3 nanometric inclusions. Beyond the classical elementary analysis based on the quantitative exploitation of core-level signals, we propose a new method of identification based on the interpretation of the fine structures in the EELS spectrum such as the near-edge structures (ELNES) at the O–K edge and the low-loss signatures. We also propose a method for determining the parameter δ in Y1Ba2Cu3O7−δ from the volume plasmon energy, which is more direct and has the same accuracy as the method proposed by Browning, based on modelling of the O–K edge.

Dates et versions

hal-01745060 , version 1 (27-03-2018)

Identifiants

Citer

C Grigis, Sylvie Schamm-Chardon. Element and phase identification via fine structure analysis in EELS: application to MOCVD-Y1Ba2Cu3O7-delta thin films. Ultramicroscopy, 1998, 74 (3), pp.159-167. ⟨10.1016/S0304-3991(98)00040-0⟩. ⟨hal-01745060⟩
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