Validation of registration techniques applied to XRD signals for stress evaluations in titanium alloys
Résumé
To estimate stresses near specimen surfaces, X-ray diffraction (XRD) is applied to titanium alloys. Some of these alloys are difficult to study since they are composed of various phases of different proportions, shapes and scales. For millimetric probed volumes, such multi-phase microstructures induce shallow and noisy diffraction signals. Two peak registration techniques are introduced and validated thanks to tensile tests performed on two titanium alloy samples.
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