Radiated Electromagnetic Emission for Integrated Circuit Authentication - Archive ouverte HAL Access content directly
Journal Articles IEEE Microwave and Wireless Components Letters Year : 2017

Radiated Electromagnetic Emission for Integrated Circuit Authentication

Abstract

Counterfeiting of integrated circuit (IC) is a growing concern in the semiconductor industry. Counterfeiting involves economical and safety issues. Both semiconductor companies and embedded system designers are looking for traceability solution in order to get assurance in IC they use. This letter proposes to use Electromagnetic (EM) radiated emission from Integrated Circuits (IC) to create a unique fingerprint for each IC. We have proposed to use a variability-aware circuit configuration which would exploit EM fingerprint for each IC. Our measurement results on two different field-programmable gate array (FPGA) families over several test boards validates this scheme. As a last step, post-processing on the obtained EM measurements is done to get a unique FPGA signature which could be used for the purpose of authentication.
Fichier principal
Vignette du fichier
C11 Radiated Electromagnetic Emission for Integrated Circuit Authentication.pdf (1.7 Mo) Télécharger le fichier
Origin : Files produced by the author(s)
Loading...

Dates and versions

hal-01724143 , version 1 (01-07-2020)

Identifiers

Cite

Mosabbah Mushir Ahmed, David Hely, Nicolas Barbot, Romain Siragusa, Etienne Perret, et al.. Radiated Electromagnetic Emission for Integrated Circuit Authentication. IEEE Microwave and Wireless Components Letters, 2017, 27 (11), pp.1028 - 1030. ⟨10.1109/LMWC.2017.2750078⟩. ⟨hal-01724143⟩

Collections

UGA XLIM LCIS
143 View
125 Download

Altmetric

Share

Gmail Facebook X LinkedIn More