Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2017
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hal-01712398 , version 1 (19-02-2018)

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B. Nafaa, B. Cretu, N. Ismail, O. Touayar, E. Simoen. Impact of cryogenic temperature operation on static and low frequency noise behaviors of FD UTBOX nMOSFETs. 2017 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS), Apr 2017, Athens, France. ⟨10.1109/ULIS.2017.7962610⟩. ⟨hal-01712398⟩
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