Article Dans Une Revue Solid-State Electronics Année : 2017

Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part II: Measurements and results

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hal-01712353 , version 1 (19-02-2018)

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D. Boudier, B. Cretu, E. Simoen, Régis Carin, A. Veloso, et al.. Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part II: Measurements and results. Solid-State Electronics, 2017, 128, pp.109 - 114. ⟨10.1016/j.sse.2016.10.013⟩. ⟨hal-01712353⟩
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