Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging - Archive ouverte HAL
Article Dans Une Revue Journal of Crystal Growth Année : 2013

Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging

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Nathalie Mangelinck-Noël  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-01708460

Soumis le : mardi 13 février 2018-16:22:33

Dernière modification le : lundi 10 juin 2024-16:58:03

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hal-01708460 , version 1 (13-02-2018)

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Amina Tandjaoui, Nathalie Mangelinck-Noël, Guillaume Reinhart, Bernard Billia, Tamzin Lafford, et al.. Investigation of grain boundary grooves at the solid–liquid interface during directional solidification of multi-crystalline silicon: in situ characterization by X-ray imaging. Journal of Crystal Growth, 2013, 377, pp.203 - 211. ⟨10.1016/j.jcrysgro.2013.05.023⟩. ⟨hal-01708460⟩

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